Price: $65,000

Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode include secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included.

This S-4700 II is fully refurbished and operational at our Tustin, CA facility.