Price: $70,000

Tailored for the mainstream need to investigate a wide variety of materials and characterize their structure and composition, the easy to use Inspect™ F50 provides a high resolution, stable platform to handle most research needs. The easy-to-use interface provides accurate and fast data collection: surface and compositional images combined with fast elemental analysis for determining material properties and elemental composition. In many areas the value of a FEG SEM for high resolution and high current helps meet the challenges to produce top quality images and fast analysis. The Inspect F50 is the perfect, flexible solution for these basic research applications.