Price: $90,000.00

The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging at ~ 1nm resolution. This instrument is a cutting-edge system capable of imaging and micro machining. The instrument is capable of 1.2nm resolution at 30kV with the SE Detector. FIB resolution is 5-7nm. Ga Ion source has an acceleration voltage of 2kV to 30kV, and the ESEM resolution is 1.5nm.