FEI XL-30 FEG SEM with EDAX EDS

FEI XL-30 Scanning Electron Microscope is the conventional SEM of the XL Series and it is suitable for a wide variety of applications. XL-30 is versatile conventional SEM with optimum performance for both imaging and microanalysis of conductive or coated specimens, user friendly, and low cost of ownership. The EDAX system is included.

This XL 30 is fully refurbished and operational at our Tustin, CA facility.

Column

Display

EDAX Detector

EDAX