Price: $110,000

The FEI Sirion SEM is the scanning microscope with a field emission filament with a resolution of 1.5 nm. The instrument is designed to satisfy the needs of the modern microscopist who wants to examine uncoated specimens at low kV and high magnification, using both through-the-lens SE and BSE imaging techniques. The instrument has two modes of operation each with its own specific benefits for the user: the Ultra High Resolution (UHR) mode and the High Resolution (HR) mode.

This instrument is also equipped with a complete range of specimen holders.